Pattern classification

Richard O. Duda, Peter E. Hart, David G. Stork

The first edition, published in 1973, has become a classic reference in the field. Now with the second edition, readers will find information on key new topics such as neural networks and statistical pattern recognition, the theory of machine learning, and the theory of invariances. Also included are worked examples, comparisons between different methods, extensive graphics, expanded exercises and computer project topics. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

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[目次]

  • Bayesian Decision Theory. Maximum-Likelihood and Bayesian Parameter Estimation. Nonparametric Techniques. Linear Discriminant Functions. Multilayer Neural Networks. Stochastic Methods. Nonmetric Methods. Algorithm-Independent Machine Learning. Unsupervised Learning and Clustering. Appendix. Index.

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この本の情報

書名 Pattern classification
著作者等 Duda, Richard O
Hart, Peter E.
Stork, David G
Stork, David G.
書名別名 Pattern classification and scene analysis
出版元 Wiley
刊行年月 c2001
版表示 2nd ed
ページ数 xx, 654 p.
大きさ 27 cm
ISBN 9780471056690
NCID BA4963402X
※クリックでCiNii Booksを表示
言語 英語
原文言語 英語
出版国 アメリカ合衆国
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