Transmission electron microscopy characterization of nanomaterials

Challa S.S.R. Kumar, editor

Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

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[目次]

  • TEM Characterization of Biological and Inorganic Nanocomposites.- Electron Microscopy of Thin Film Inorganic and Organic Photovoltaic Materials.- TEM for Characterization of Semiconductor Nanomaterials.- Study of Polymeric Nano-Composites by 3D-TEM and Related Techniques.-TEM for Characterization of Nanowires and Nanorods.- TEM for Characterization of Core-Shell Nanomaterials.- Valence Electron Spectroscopy by Transmission Electron Microscopy.- TEM Characterization of Nanocomposite Materials.- High Resolution in STEM Mode: Individual Atom Analysis in Semiconductor Nanowires.- Electron Microscopy for Characterization of Thermoelectric Nanomaterials.- TEM for Characterization of Nanocomposites Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites.- TEM Characterization of Metallic Nanocatalysts.- 3D Electron Microscopy Applied to Nanoscience.-Transmission Electron Microscopy of 1D-Nanostructures

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この本の情報

書名 Transmission electron microscopy characterization of nanomaterials
著作者等 Kumar, C. S. S. R.
Kumar Challa S. S. R.
出版元 Springer-Verlag Berlin and Heidelberg GmbH & Co. K
刊行年月 c2014
ページ数 ix, 716 p
大きさ 25 cm
ISBN 9783642389337
NCID BB21620489
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言語 英語
出版国 ドイツ
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