Scanning Probe Microscopy Using Chemically Modified Tips(化学修飾探針を用いた走査型プローブ顕微鏡に関する基礎研究)

[目次]

  • Table of Contents / p1
  • Chapter1 General Introduction / p5
  • Chapter2 STM and AFM / p7
  • 2.1. Scanning Probe Microscopy(SPM) / p7
  • 2.2. Scanning Tunneling Microscopy(STM) / p9
  • 2.3. Atomic Force Microscopy(AFM) / p24
  • Chapter3 Thin Films Used in the Present Study / p41
  • 3.1. SAMs of Siloxanes / p41
  • 3.2. SAMs of thiols / p45
  • 3.3. Thin Films of Polypyrroles / p46
  • 3.4. Monolayers of Primarily Substituted Hydrocarbons / p51
  • Chapter4 Scanning Tunneling Microscopy Using Tips Modified with Self-Assembled Monolayers / p59
  • 4.1. Introduction / p59
  • 4.2. Experimental Section / p61
  • 4.3. Results and Discussion / p63
  • 4.4. Conclusions / p79
  • Chapter5 Polypyrrole Coated Tips for Functional Group Recognition with Scanning Tunneling Microscopy / p80
  • 5.1. Introduction / p80
  • 5.2. Experimental Section / p81
  • 5.3. Results and Discussion / p82
  • 5.4. Conclusions / p96
  • Chapter6 Modification of Silicon Nitride Tips with Trichlorosilane Self-Assembled Monolayers(SAMs)for Chemical Force Microscopy / p97
  • 6.1. Introduction / p97
  • 6.2. Experimental Section / p99
  • 6.3. Results and Discussion / p105
  • 6.4. Conclusions / p120
  • Chapter7 Observation of Complexation Forces between Ionic Species and Surface Functional Groups of Organosiloxane SAMs with Atomic Force Microscopy / p121
  • 7.1. Introduction / p121
  • 7.2. Experimental Section / p122
  • 7.3. Results and Discussion / p127
  • 7.4. Conclusions / p138
  • Chapter8 General Conclusions / p139
  • References / p142
  • Acknowledgments / p157

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書名 Scanning Probe Microscopy Using Chemically Modified Tips(化学修飾探針を用いた走査型プローブ顕微鏡に関する基礎研究)
著作者等 伊藤貴志
書名別名 Scanning Probe Microscopy Using Chemically Modified Tips 化学 修飾 探針 走査型 プローブ 顕微鏡 基礎
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