Fundamental study on the possibility of hot electron detection with a scanning probe microscope

[目次]

  • 論文目録
  • Contents
  • Chapter1 Introduction / p1
  • 1.1 Hot Electrons in Semiconductor Structures / p1
  • 1.2 Why(and how)Hot Electron Detection? / p9
  • 1.3 Scanning Tunneling Microscopy(STM)and Related Methods / p14
  • 1.4 Purpose and Structure of this thesis / p24
  • Chapter2 Inverse Ballistic-Electron-Emission Microscopy / p26
  • 2.1 Introduction / p26
  • 2.2 A Simple Approach:Inverse Ballistic-Electron-Emission Microscope / p27
  • 2.3 Basic Experimental Problems / p30
  • 2.4 The Role of the Residual Series Resistance / p32
  • 2.5 Method of Calculation / p36
  • 2.6 Results and Discussion / p39
  • 2.7 Summary / p43
  • Chapter3 Proposal of Scanning Hot Electron Microscopy(SHEM) / p46
  • 3.1 Introduction / p46
  • 3.2 Principles of SHEM Operation / p47
  • 3.3 Conditions for Hot Electron Detection with SHEM / p49
  • 3.4 Possibility of Hot Electron Detection with SHEM / p52
  • 3.5 Summary / p71
  • Chapter4 Hot Electron Emitter for SHEM / p72
  • 4.1 Introduction / p72
  • 4.2 Experimental Requirements / p73
  • 4.3 The Si/CaF₂/Au Structure / p75
  • 4.4 Hot Electron Emitter / p77
  • 4.5 Summary / p90
  • Chapter5 Experimental Hot Electron Detection with SHEM / p91
  • 5.1 Introduction / p91
  • 5.2 Experimental Setup Revisited / p92
  • 5.3 SHEM Experiments / p103
  • 5.4 Experimental Results and Discussion / p104
  • 5.5 Summary / p110
  • Chapter6 Conclusion / p111
  • Acknowledgements / p116
  • References / p118
  • List of Publication / p125

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この本の情報

書名 Fundamental study on the possibility of hot electron detection with a scanning probe microscope
著作者等 Francisco Vázquez
書名別名 走査プローブ顕微鏡によるホットエレクトロン検出の可能性に関する基礎研究
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